Nov 25, 2025

US12481087 - Infrared selective emitter with improved wear resistance

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The present invention provides an infrared selective emitter that can selectively emit infrared energy in a desired wavelength band, can be easily applied to a curved surface due to its flexible properties, and can protect the formed surface structure of the infrared selective emitter from external stimuli such as friction, thereby improving wear resistance and maximizing the function of infrared selective emission.

Assignee: UIF (University Industry Foundation), Yonsei University
Inventors: Hyung Hee Cho, Nam Kyu Lee, Joon-Soo Lim, In Joong Chang, Ju Yeong Nam
Filing date: 2023-02-22

The invention describes an infrared selective emitter designed to emit infrared energy within a specific wavelength range while enhancing wear resistance through a protective coating. This emitter features a flexible substrate and a metasurface structure that maintains its emissivity even after undergoing a rigorous brush test.

Claim 1

1 . An infrared selective emitter including: a substrate; a conductive thin film layer disposed on the substrate; a metasurface part in which a plurality of structures comprising an insulating layer and a metal layer stacked on each other are arranged in a predetermined pattern on the conductive thin film layer; and a protective coating layer having a predetermined thickness and covering the metasurface part to prevent the plurality of structures from falling off, wherein the ratio (a/b) of the emissivity (b) at an infrared wavelength of 3 to 5 μm for the infrared selective emitter and the emissivity (a) at an infrared wavelength of 3 to 5 μm measured after a brush test according to the following experimental method is 0.9 or more and 1.0 or less, wherein: the brush test is performed by repeating a process 30 to 50 times in which any 1.5 cm×1.5 cm area of the surface of the specimen is manually swept using a nylon brush, and an emissivity for the area is measured using Fourier transform infrared (FT-IR) equipment. a substrate; a conductive thin film layer disposed on the substrate; a metasurface part in which a plurality of structures comprising an insulating layer and a metal layer stacked on each other are arranged in a predetermined pattern on the conductive thin film layer; and a protective coating layer having a predetermined thickness and covering the metasurface part to prevent the plurality of structures from falling off, wherein the ratio (a/b) of the emissivity (b) at an infrared wavelength of 3 to 5 μm for the infrared selective emitter and the emissivity (a) at an infrared wavelength of 3 to 5 μm measured after a brush test according to the following experimental method is 0.9 or more and 1.0 or less, wherein: the brush test is performed by repeating a process 30 to 50 times in which any 1.5 cm×1.5 cm area of the surface of the specimen is manually swept using a nylon brush, and an emissivity for the area is measured using Fourier transform infrared (FT-IR) equipment.

Google Patents

https://patents.google.com/patent/US12481087

USPTO PDF

https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/12481087